EPC2088 EPC eGaN® FET Automotive Qualification Report

2023-01-06
●This report summarizes the Product Qualification results for EPC part numbers EPC2088, EPC2204A, EPC2218, EPC2204A, EPC2218A and EPC2302 meet all required qualification requirements and are released for production.
●Scope: The testing matrix in this qualification report covers the qualification of EPC2088, a wafer level chip scale package 100 V eGaN power transistor. For device level tests, EPC2088 is qualified by matrix with EPC2218 and EPC2302 that have identical voltage ratings and share the same device design and process. Similarly, for package related reliability tests, EPC2088 is qualified by matrix with EPC2218A and EPC2204A, where they utilize the same packaging technology platform.
●Qualification Test Overview
■EPC’s eGaN FETs were subjected to a wide variety of stress tests under conditions that are typical for silicon-based power MOSFETs. These tests included:
▲High temperature, reverse bias (HTRB): Parts are subjected to a drain-source voltage at the maximum rated temperature
▲High temperature, gate bias (HTGB): Parts are subjected to a gate-source voltage at the maximum rated temperature
▲High temperature storage (HTS): Parts are subjected to heat at the maximum rated temperature
▲Moisture sensitivity level 1 (MSL1): Parts are subjected to moisture, temperature, and three cycles of reflow. MSL1 is the most stringent of the moisture sensitivity levels, requiring 85°C and 85% humidity for 168 hours.
▲High temperature, high humidity, reverse bias (H3TRB): Parts are subjected to humidity under high temperature with a drain-source voltage applied
■The stability of the devices is verified with DC electrical tests after stress biasing. The electrical parameters are measured at time-zero and at interim readout points at room temperature. Electrical parameters such as the gate-source leakage, drain-source leakage, gate-source threshold voltage, and on-state resistance are compared against the data sheet specifications. A failure is recorded when a part exceeds the datasheet specifications. eGaN FETs are stressed to meet the latest Joint Electron Device Engineering Council (JEDEC) standards when possible.
■Parts for all tests except for TC were mounted onto high Tg FR4 adaptor cards. Adaptor cards of 1.6 mm in thickness with two copper layers were used. The top copper layer was 1 oz. or 2 oz., and the bottom copper layer was 1 oz.

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EPC2088EPC2218EPC2302EPC2218AEPC2204A

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2022/12/22

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