Reliability Qualification Report for DDR4 SDRAM with Pb/Halogen Free (512M×16, 20nm SDRAM AS4C512M16D4A-62BIN)

2024-03-12
●INTRODUCTION
■In order to meet the most stringent market demands for high quality and reliability semiconductor components, Alliance maintains a strict reliability program in all products. The purpose of this report is to give an overview of the reliability status of AS4C512M16D4A-62BIN. Accelerated tests are performed on product, and then the results are extrapolated to standard operating conditions in order to calculate and estimate the component’s failure rate.

Alliance

AS4C512M16D4A-62BIN

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512M*16 bits high-speed CMOS Double Data Rate Four Synchronous Dynamic Random Access Memory512M*16 bits high-speed CMOS Double DDR4 SDRAM

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Test Report

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Feb 15, 2024

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