Circuit Simulation Using EPC Device Models
●Status of current models: Years of refinement have gone into the development of silicon power MOSFET device models. Early attempts were based on a fitting of device behavior with functions of the approximate shape, polynomials of many orders, or simple look-up tables. Recent trends have been toward solving multidimensional electrostatic conditions from the basic underlying physics - a daunting task - but great simplification in the final solution has been achieved using this approach. Only a few papers have been published on the development of spice models for GaN. In addition, GaN has many new properties, such as spontaneous and piezo-electric polarization, that have only recently begun to be incorporated into physics based models. EPC V091 models presented in this paper, are a hybrid of physics-based and phenomenological functions to achieve a compact spice model with acceptable simulation and convergence characteristics. Temperature effects have also been included for conductivity and threshold parameters. Although quantum-based effects have not been incorporated, the models accurately reproduce the basic response of the devices under circuit operation conditions. A number of improvements are under development to include field dependent mobility and gate injection current.
enhancement mode gallium nitride power transistors 、 eGaN® power transistors 、 eGaN power transistors 、 GaN Power Transistor 、 power switches |
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[ RF applications ] |
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Application note & Design Guide |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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2019/12/20 |
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AN005 |
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1.1 MB |
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