UF3N170400B7S Discrete D2PAK-7L SiC JFETs Product Qualification Report
●The environmental stress tests listed below are performed with pre-stress and post-stress electrical tests. Reviewing the electrical results for new failures and any significant shift performance satisfies the JEDEC qualification requirements, as well as UnitedSiC's Quality requirements. This device was tested to MSL1 standards.
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Test Report |
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Please see the document for details |
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D2PAK-7L |
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English Chinese Chinese and English Japanese |
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2021/10/01 |
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224 KB |
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