CW32L031 HBM TEST REPORT(SH2201260098)

2023-12-04

●INFORMATION
■CASE INFORMATION
▲Test Sample: CW32L031
▲LOT NO.: NA
▲Package: LQFP48
▲Quantity: 3 pcs
■DESCRIPTION OF TEST EQUIPMENT
▲Items: 1
▲Equipment/No.: 1409189
▲Model: KEYTEK ZAPMASTER MK2 768
■REFERENCE DOCUMENT
▲Items: 1
▲Standards: ANSI/ESDA/JEDEC JS-001-2017
■TEST REQUIREMENT
▲Group02 TO Group03 (+/-) STEP: 8000V
▲Group04 TO Group01 (+/-) STEP: 8000V
▲IOGroup01 TO IOGroup01 (+/-) STEP: 8000V
▲REFERENCE DOCUMENT:ANSI/ESDA/JEDEC JS-001-2017 Zap 1 pulse(s), Interval: 0.3 Sec.
▲10K ohm shunt:Load (※ Add Load 10KΩ is to eliminate the machine Pre-Pulse event.)
▲TEST VOLTAGE:8000V(±)
▲SAMPLE QUANTITY:3 pcs
▲FAILURE CRITERIA ( Reference Only ):±30% voltage shift at reference point before/after zapping
■TEST RESULTS
▲Group Set:Pin List
◆Group01:1,9,24,48
◆Group02:1-7,9-22,24-46,48
◆Group03:8,23,47
◆Group04:2-8,10-23,25-47
◆IOGroup01:2-7,10-22,25-46

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CW32L031

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Test Report

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LQFP48

English Chinese Chinese and English Japanese

2022/2/18

Version :A

SH2201260098;SH2201260098A;IECQ-L DEKRA 17.0004-01

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