CW32L031 MM TEST REPORT(SH2201260098)
■CASE INFORMATION
▲Test Sample: CW32L031
▲LOT NO.: NA
▲Package: LQFP48
▲Quantity: 3 pcs
■DESCRIPTION OF TEST EQUIPMENT
▲Items: 1
▲Equipment/No.: 1409189
▲Model: KEYTEK ZAPMASTER MK2 768
■AMBIENCE CONDITION
▲Required temperature: 25+3 -5 °C
▲Required relative humidity: 55± 10 %RH
▲Actual temperature: 23.6~24.2°C
▲Actual humidity: 51.3~51.8% RH
■REFERENCE DOCUMENT
▲Items: 1
▲Standards: JEDEC EIA/JESD22-A115C
■TEST REQUIREMENT
▲Group02 TO Group03 (+/-) STEP: 400V,500V
▲Group04 TO Group01 (+/-) STEP: 400V,500V
▲IOGroup01 TO IOGroup01 (+/-) STEP: 400V,500V
▲REFERENCE DOCUMENT:JEDEC EIA/JESD22-A115C Zap 1 pulse(s), Interval: 0.5 Sec.
▲TEST VOLTAGE:400V(±),500V(±)
▲SAMPLE QUANTITY:3 pcs
▲FAILURE CRITERIA ( Reference Only ):±30% voltage shift at reference point before/after zapping
■TEST RESULTS
▲Group Set:Pin List
◆Group01:1,9,24,48
◆Group02:1-7,9-22,24-46,48
◆Group03:8,23,47
◆Group04:2-8,10-23,25-47
◆IOGroup01:2-7,10-22,25-46
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Test Report |
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Please see the document for details |
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LQFP48 |
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English Chinese Chinese and English Japanese |
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2022/2/18 |
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Version :A |
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SH2201260098;SH2201260098 A;IECQ-L DEKRA 17.0004-01 |
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1.1 MB |
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