Switching Between C-V and I-V Measurements Using the 4200A-CVIV Multi-Switch and 4200A-SCS Parameter Analyzer––APPLICATION NOTE
■Full parametric characterization of a semiconductor device usually requires an array of tests to gather all of the device’s important parameters. Current-voltage (I-V) tests are used to determine device parameters like transfer characteristics, leakages, and breakdown voltages. Capacitance-voltage (C-V) tests are used to determine device parameters like doping concentrations, interface charges, and threshold voltages. It is very common to perform both I-V and C-V tests on the same device, but the two test types require different test equipment and cabling. These differences make it difficult to perform I-V and C-V measurements on the same device quickly because changing test types typically requires recabling the entire system.
■When configured with 4200-SMU or 4210-SMU Source Measure Units (SMUs) and the 4210-CVU Capacitance Voltage Unit, the 4200A-SCS Parameter Analyzer is capable of performing both I-V and C-V measurements. However, the SMUs use triaxial cables and the CVU uses SMA coaxial cables. Combining the 4200A-SCS Parameter Analyzer with the 4200A-CVIV Multi-Switch eliminates these difficulties because the 4200A-CVIV is capable of switching between I-V and C-V measurements with no need to change cables or lift probe tips. The Clarius software that runs on the 4200A-SCS makes it simple to control the Multi-Switch and creates a faster, more efficient device testing workflow for any application that requires making I-V and C-V measurements on the same device.
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Application note & Design Guide |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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2016/7/13 |
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1KW-60635-0 |
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1.2 MB |
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