FERRITE CHIP BEAD、FERRITE CHIP INDUCTOR、ARRAY、MCF、MCM、YMV、APM SERIES SGS 测试报告 ETR20C00900 (FERRITE CHIP BEAD、FERRITE CHIP INDUCTOR、ARRAY、MCF、MCM、YMV、APM SERIES SGS Test Report ETR20C00900)
■ The following sample(s) was/were submitted and identified by/on behalf of the applicant as：
● 样品名称: FERRITE CHIP BEAD、FERRITE CHIP INDUCTOR、ARRAY、MCF、MCM、YMV、APM SERIES
● Sample Name: FERRITE CHIP BEAD、FERRITE CHIP INDUCTOR、ARRAY、MCF、MCM、YMV、APM SERIES
● 样品型号: FERRITE CHIP BEAD、FERRITE CHIP INDUCTOR、ARRAY、MCF、MCM、YMV、APM SERIES
● Style/Item No.: FERRITE CHIP BEAD、FERRITE CHIP INDUCTOR、ARRAY、MCF、MCM、YMV、APM SERIES
● 收件曰: 03-Dec-2020
● Sample Receiving Date: 03-Dec-2020
● 测试期间: 03-Dec-2020 to 10-Dec-2020
● Testing Period: 03-Dec-2020 to 10-Dec-2020
■ 测试需求: 依据客户要求进行测试，测试项目请参阅测试结果表格。
■ Test Requested: Testing item(s) is/are specified by client. Please refer to result table for testing item(s).
■ 测试结果: 请参阅下一页
■ Test Results: Please refer to following pages.
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MCF 、 MCM 、 YMV 、 APM 、 MCF SERIES 、 MCM SERIES 、 YMV SERIES 、 APM SERIES |
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Test Report |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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10-Dec-2020 |
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ETR20C00900 |
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692 KB |
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