FERRITE CHIP BEAD、FERRITE CHIP INDUCTOR、ARRAY、MCF、 MCM、YMV、APM SERIES 测试报告 CE/2019/C0498 (FERRITE CHIP BEAD、FERRITE CHIP INDUCTOR、ARRAY、MCF、 MCM、YMV、APM SERIES Test Report CE/2019/C0498)

2022-03-28
■ 以下测试样品系由申请厂商所提供及确认:
■ The following sample(s) was/were submitted and identified by/on behalf of the applicant as:
● 样品名称: FERRITE CHIP BEAD、FERRITE CHIP INDUCTOR、ARRAY、MCF、 MCM、YMV、APM SERIES
● Sample Description: FERRITE CHIP BEAD、FERRITE CHIP INDUCTOR、ARRAY、MCF、 MCM、YMV、APM SERIES
● 样品型号: FERRITE CHIP BEAD、FERRITE CHIP INDUCTOR、ARRAY、MCF、 MCM、YMV、APM SERIES
● Style/Item No.: FERRITE CHIP BEAD、FERRITE CHIP INDUCTOR、ARRAY、MCF、 MCM、YMV、APM SERIES
■ 测试结果:
■ Test Results:
● 请参阅下一页.
● Please refer to following pages.

TAI-TECH

MCFMCMYMVAPM SERIESAPM

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FERRITE CHIP BEADFERRITE CHIP INDUCTOR

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Test Report

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2019/12/10

CE/2019/C0498

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