Model F1270 High-capacity load cell up to 300 t
●Measuring ranges 0 ... 7.5 t to 0 ... 300 t
●For compression forces
●Ingress protection IP68, hermetically sealed
●Relative linearity error from 0.0166 % F-nom
■Description
▲The model F1270 high-capacity load cell is available with rated loads of 7.5 t to 300 t and has been specially developed for application in container and silo weighing technology.
▲It is also suitable for use in harsh industrial applications and in the construction of testing and production plants, where robustness and long-term stability are required.
▲With its special geometry this high-capacity load cell is excellently suited for installation in truck scales. Here it automatically aligns itself in such a way that there is no need for complex and precise positioning of the vehicle on the weighing platform.
▲The use of stainless steel, the welded cover of the strain gauge measuring elements and a glass feed-through for the cable connection allow trouble-free use even under unfavour-able ambient conditions.
▲Due to the integrated radii of the load supports, the instal-lation can be carried out with simple force introduction elements.
●Options
▲Integrated surge arresters (4 x)
▲Accessory mounting kits
|
[ Weighing ][ dosing systems ][ silo weighing ][ Production lines ][ Testing and production plants ][ Truck scales ] |
|
|
Datasheet |
|
|
|
|
Please see the document for details |
|
|
|
|
|
|
|
|
|
|
|
English Chinese Chinese and English Japanese |
|
|
10/2020 |
|
|
|
|
|
|
|
|
417 KB |
- +1 Like
- Add to Favorites
Recommend
- Nidec’s Driving Motor is Adopted for WHILL’s Foldable Mobility Product, “WHILL Model F”
- Epson Researchers Create 3-D Analytical Model to Accelerate Development of Next-generation Axial-flux Permanent Magnet Motors
- Keysight Announces New Device Modeling Software to Enable One-Stop Workflow
- TE Model 41 Crash Test Accelerometer: Designed for Crush Zone Testing
- The Model EGAS-S398C NCAP Pedestrian Impact Test Sensor Available in Ranges from ±50g to ±2000g
- Southeast University and Julin Technology Jointly Published GaN SPICE Modeling Paper on IEEE TPEL
- Addressing Device Modeling Challenges for Advanced Technologies
- Keysight and CTTL Complete First CTIA MIMO Over-the-Air Dynamic Channel Model Test System Validation
All reproduced articles on this site are for the purpose of conveying more information and clearly indicate the source. If media or individuals who do not want to be reproduced can contact us, which will be deleted.
Integrated Circuits
Discrete Components
Connectors & Structural Components
Assembly UnitModules & Accessories
Power Supplies & Power Modules
Electronic Materials
Instrumentation & Test Kit
Electrical Tools & Materials
Mechatronics
Processing & Customization
