PD1500A Series Dynamic Power Device Analyzer/Double-Pulse Tester for discrete IGBT, SiC, and GaN devices
Power converters are a key component enabling the electrification of the transportation, renewable energy and industrial markets. To facilitate needed advances in power converter design, new wide-bandgap (WBG) semiconductor technologies, based on silicon carbide (SiC) and gallium nitride (GaN), are being commercialized. WBG semiconductors provide major leaps in speed (10x to 100x faster than older designs), higher voltage and thermal operation, which in turn improve efficiency, reduce size and cost.
However, the resulting high-performance power converters are proving difficult to design due to many new challenges when characterizing WBG semiconductors. These difficulties delay the innovation of semiconductor manufacturers and engineers designing new converters.
Homegrown test systems have been the primary source for characterizing WBG semiconductors. Building these systems has been necessary because, to date, commercially available test systems have not been readily available. Unfortunately, it is difficult to produce repeatable and reliable measurement results with one-off , “homegrown” testers. Unreliable results create additional obstacles for power-converter designers when correlating their measurements with the semiconductor’s data sheets.
To enable consistent, reliable characterization of WBG semiconductors, Keysight created thePD1500A dynamic power device analyzer platform. Initially employing the Double Pulse Test (DPT) technique, it has been developed in close collaboration with semiconductor manufacturers and designers from the energy and electric vehicle (EV) industries.
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[ transportation ][ renewable energy ][ industrial markets ] |
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Please see the document for details |
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TO-247-3;TO-247-4;D2PAK7 |
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English Chinese Chinese and English Japanese |
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July 17, 2020 |
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5992-3942EN |
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1.7 MB |
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