PD1500A Series Dynamic Power Device Analyzer/Double-Pulse Tester for discrete IGBT, SiC, and GaN devices DATA SHEET

PublishTime：2021-05-18

Power converters are a key component enabling the electrification of the transportation, renewable energy and industrial markets. To facilitate needed advances in power converter design, new wide-bandgap (WBG) semiconductor technologies, based on silicon carbide (SiC) and gallium nitride (GaN), are being commercialized. WBG semiconductors provide major leaps in speed (10x to 100x faster than older designs), higher voltage and thermal operation, which in turn improve efficiency, reduce size and cost.
However, the resulting high-performance power converters are proving difficult to design due to many new challenges when characterizing WBG semiconductors. These difficulties delay the innovation of semiconductor manufacturers and engineers designing new converters.
Homegrown test systems have been the primary source for characterizing WBG semiconductors. Building these systems has been necessary because, to date, commercially available test systems have not been readily available. Unfortunately, it is difficult to produce repeatable and reliable measurement results with one-off , “homegrown” testers. Unreliable results create additional obstacles for power-converter designers when correlating their measurements with the semiconductor’s data sheets.
To enable consistent, reliable characterization of WBG semiconductors, Keysight created the PD1500A dynamic power device analyzer platform. Initially employing the Double Pulse Test (DPT) technique, it has been developed in close collaboration with semiconductor manufacturers and designers from the energy and electric vehicle (EV) industries.

Brand of Product：	Keysight
Part#：	PD1500A Series 、 PD1500A 、 B1506A 、 PD1500 More Part#
Product Category：	Dynamic Power Device Analyzer 、 Double-Pulse Tester More
Application：	[ discrete IGBT devices ][ discrete SiC devices ][ discrete GaN devices ] More
Data Type：	Datasheet More
Safety & Environment Standards：	More
Operating Temperature：	Please see the document for details
Qualification Grade：	More
Qualification Approval：	More
Package：	SMD;TO-247
Language：	English Chinese Chinese and English Japanese
Date of Creation：	July 17, 2020
Version Number：
Data Encoding：	5992-3942EN
Data Size：	1.7 MB

Data section preview(2pages)

- The full preview is over. If you want to read the whole 16 page document,please Sign in/Register -

Download

+1 Like
Add to Favorites

Recommend

New Products & Solutions

More>

Technical Resources

More>

All reproduced articles on this site are for the purpose of conveying more information and clearly indicate the source. If media or individuals who do not want to be reproduced can contact us, which will be deleted.

Integrated Circuits