PD1500A Dynamic Power Device Analyzer/Double Pulse Tester

PublishTime：2020-08-19

Power converters are akey component enabling the electrification of the transportation, renewable energy and industrial markets. To facilitate neededadvances in power converter design, new wide-bandgap (WBG) semiconductor technologies, based onsilicon carbide (SiC) and gallium nitride (GaN), are being commercialized. WBG semiconductors provide major leaps in speed (10x to 100x faster than older designs), higher voltage and thermal operation, which in turn improve efficiency, reduce size and cost.However, the resulting high-performance power converters are proving difficult to design due tomany new challenges when characterizingWBG semiconductors. These difficultiesdelay theinnovationof semiconductor manufacturers and engineersdesigning newconverters.Homegrown testsystemshave been the primarysourcefor characterizingWBG semiconductors. Building thesesystems hasbeen necessary because, to date, commercially availabletestsystemshave not been readily available. Unfortunately, it is difficult to produce reliable and repeatable measurement results with one-off testers. Unreliable results create additional obstacles for power-converter designers when correlatingtheir measurements with the semiconductor’s data sheets.To enable consistent,reliable characterization of WBG semiconductors, Keysight created the PD1500A dynamic power device analyzer platform.Initially employing the Double Pulse Test (DPT) technique, it has been developed in close collaboration with semiconductor manufacturers anddesigners from energy and electric vehicle (EV)industries.

As an off-the-shelf measurement solution, the PD1500A deliversreliable, repeatable measurements of WBG semiconductors. The platform ensuresusersafety andprotection ofthe system’s measurement hardware.The ability to ensure repeatable DPT results is built on Keysight’s expertise in measurement science. Examples include innovations in high-frequency testing (gigahertz range), low leakage (femto-ampere range), and pulsed power (1,500 A current, 10 μs resolution). As a result, Keysight is uniquely positioned to helpyou overcome the challenges of dynamic power-semiconductor characterization. Included with the PD1500Aarestandard measurement techniques such as probe compensation, offset adjustment, de-skewing, and common mode noise rejection. These techniques are utilized within an innovative measurement topology and layout.Asemi-automated calibration routine(AutoCal)that corrects for system gain and offset errorswas specifically developed for this system. The system also uses de-embedding techniques to compensate for inductive parasitics in the current shunt.

Fully characterizing a SiC-or GaN-based WBG device requiresbothstatic and dynamic measurements. Keysight’s B1505A and B1506A power device analyzers excel at static measurements. The PD1500A has theneededflexibility to address a variety of dynamic measurementsand the evolution of JEDEC standards as they take shape.

Static measurements:The following parameters are typically used to understand the static characteristics of a power device:
•Output characteristics
•On-resistance
•Threshold voltage
•Transconductance
•Junction, input, output and reverse transfer capacitance
•Breakdown voltage
•Gate charge

Brand of Product：	Keysight
Part#：	PD1500A More Part#
Product Category：	Dynamic Power Device Analyzer 、 Double Pulse Tester More
Application：	More
Data Type：	Datasheet More
Safety & Environment Standards：	More
Operating Temperature：	Please see the document for details
Qualification Grade：	More
Qualification Approval：	More
Package：
Language：	English Chinese Chinese and English Japanese
Date of Creation：	December 16, 2019
Version Number：
Data Encoding：	5992-3942EN
Data Size：	1.3 MB

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