PD1500A Dynamic Power Device Analyzer/Double Pulse Tester
As an off-the-shelf measurement solution, the PD1500A deliversreliable, repeatable measurements of WBG semiconductors. The platform ensuresusersafety andprotection ofthe system’s measurement hardware.The ability to ensure repeatable DPT results is built on Keysight’s expertise in measurement science. Examples include innovations in high-frequency testing (gigahertz range), low leakage (femto-ampere range), and pulsed power (1,500 A current, 10 μs resolution). As a result, Keysight is uniquely positioned to helpyou overcome the challenges of dynamic power-semiconductor characterization. Included with the PD1500Aarestandard measurement techniques such as probe compensation, offset adjustment, de-skewing, and common mode noise rejection. These techniques are utilized within an innovative measurement topology and layout.Asemi-automated calibration routine(AutoCal)that corrects for system gain and offset errorswas specifically developed for this system. The system also uses de-embedding techniques to compensate for inductive parasitics in the current shunt.
Fully characterizing a SiC-or GaN-based WBG device requiresbothstatic and dynamic measurements. Keysight’s B1505A and B1506A power device analyzers excel at static measurements. The PD1500A has theneededflexibility to address a variety of dynamic measurementsand the evolution of JEDEC standards as they take shape.
Static measurements:The following parameters are typically used to understand the static characteristics of a power device:
•Output characteristics
•On-resistance
•Threshold voltage
•Transconductance
•Junction, input, output and reverse transfer capacitance
•Breakdown voltage
•Gate charge
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Datasheet |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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December 16, 2019 |
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5992-3942EN |
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1.3 MB |
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