Keysight Technologies Measuring CNT FETs and CNT SETs Using the Keysight B1500A
■Exotic carbon nanotube (CNT) structures have generated a great deal of interest in the scientific community. There are many potential applications for CNTs, but much of the current focus in nanotechnology research is centered on electrical component structures, such as the CNT field effect transistor (FET) and the CNT single electron transistor (SET).
■The Keysight Technologies, Inc. 4155C and 4156C have been the de facto industry standard instruments for semiconductor device characterization for many years. In addition, they are very effective tools for nanotechnology device characterization. However, the new Keysight B1500A Semiconductor Device Analyzer is also an excellent instrument for analyzing the electrical properties of nanotechnology devices, and it has added benefits not found in the 4155C and 4156C.
■The content of this application note is based on a study conducted by Professor K. Matsumoto of Osaka University. In his study Professor Matsumoto focused on how chirality determines the electrical properties of CNT FETs and CNT SETs, using the 4156C Precision Semiconductor Parameter Analyzer as the measurement tool. The new B1500A would have worked equally well for this study, and the B1500A offers added benefits, among which is an application library that contains the application tests necessary to perform these measurements.
■CNTs have also been studied as materials for ultra large scale integration (ULSI) interconnection because they can support extremely high current densities (1000 times larger than those of Cu), and CNTs possess very high thermal conductivity (10 times greater than that of Cu). CNTs also show promise as the electrical source in field emission displays, and a close relative, the carbon nano-horn, shows potential as a material for constructing fuel cells. The B1500A is an excellent tool for characterizing these fundamental CNT structures.
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Application note & Design Guide |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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July 31, 2014 |
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5989-2842EN |
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3.8 MB |
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