transistor (MOS eco-friendly/high temp. solder/copper lead frame) RoHS (SGS) Test Report (CANEC24004133506)

2024-06-29
●Client Name: SHENZHEN SI SEMICONDUCTORS CO.,LTD. ●Sample Name: transistor (MOS eco-friendly/high temp. solder/copper lead frame) ●The above sample(s) and information were provided by the client. ●SGS Job No.: SZP24-008714 ●Sample Receiving Date: Mar 11, 2024 ●Testing Period: Mar 11, 2024 ~ Mar 23, 2024 ●Test Requested: Select test(s) as requested by the client. ●Test Requirement ■EU RoHS Directive (EU) 2015/863 amending Annex II to Directive 2011/65/EU- Lead, Mercury, Cadmium, Hexavalent chromium, Polybrominated biphenyls (PBB), Polybrominated diphenyl ethers (PBDE), Bis(2-ethylhexyl) phthalate (DEHP), Butyl benzyl phthalate (BBP), Dibutyl phthalate (DBP) and Diisobutyl phthalate (DIBP) ▲Conclusion: Pass ■EU RoHS Directive (EU) 2015/863 amending Annex II to Directive 2011/65/EU- Lead, Mercury, Cadmium and Hexavalent chromium ▲Conclusion: Pass ■Perfluorooctane sulfonates (PFOS) and its derivatives and Perfluorooctanoic acid (PFOA) and its salts ■Halogen ■Element(s) ■Red Phosphorus ■Dimethyl fumarate (DMFu) ●EU RoHS Directive (EU) 2015/863 amending Annex II to Directive 2011/65/EU - Lead, Mercury, Cadmium, Hexavalent chromium, Polybrominated biphenyls (PBB), Polybrominated diphenyl ethers (PBDE), Bis(2-ethylhexyl) phthalate (DEHP), Butyl benzyl phthalate (BBP), Dibutyl phthalate (DBP) and Diisobutyl phthalate (DIBP) ●Test Method: With reference to IEC 62321-4:2013+AMD1:2017, IEC 62321-5:2013, IEC 62321-7-2:2017, IEC 62321-6:2015 and IEC 62321-8:2017, analysis was performed by ICP-OES/AAS, UV-Vis and GC-MS.

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Mar 26, 2024

CANEC24004133506

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