ACS Basic Software Quick Start Guide
●Optimized for parametric testing of component and discrete (packaged) semiconductor devices, ACS Basic Edition maximizes the productivity of technicians and engineers in research and development. The versatile architecture of this software allows it to meet the wide ranging and ever changing requirements of semiconductor device testing. It supports all of Keithley’s source and measure instrument products, including Series 2600B, Series 2400, and Models 2651A and 2657A SourceMeter® instruments, Model 237 SMU, and Model 4200-SCS SMUs. This powerful, yet cost effective solution includes Keithley’s rich set of proven parametric libraries. Simply choose the desired test and begin running it to immediately start gathering data and analyzing it. You also have the option of customizing any test with the embedded script editor. The built-in data analysis tools allow you to quickly analyze the parametric data. For example, place device curves developed from newly collected data over “golden” curves for fast comparisons. To perform specialized calculations on raw data, use the mathematical formulator tool to create customized parameter calculations. Data can be easily saved in graphical and/or tabular formats.
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User's Guide |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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September 2014 |
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Rev.B |
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ACSSBASIC-903-01 |
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1.1 MB |
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