Temperature Excursion Usage Guide for Lattice Devices Technical Note
●Semiconductor manufacturers specify a device lifetime through an accelerated life test,which measures how long a device runs at a selected temperature before it fails.Typically, devices are expected to operated within this specified temperature range. Temperature excursion, as defined in this Technical Note, allows for the device to operate outside the specified temperature range for a specified maximum duration.
●Lattice families of devices typically come in three grades:commercial, industrical,and automotive. The Lattice industrial grade devices support a junction temperature range of –40°C to 100°C.The list of devices in this Technical Note support an excursion of 10°C above the maximum temperature listed in the respective data sheets.
|
|
|
|
|
|
|
Application note & Design Guide |
|
|
|
|
Please see the document for details |
|
|
|
|
|
|
|
|
|
|
|
English Chinese Chinese and English Japanese |
|
|
September 2021 |
|
|
Revision 1.0 |
|
|
FPGA-TN-02263-1.0 |
|
|
690 KB |
- +1 Like
- Add to Favorites
Recommend
All reproduced articles on this site are for the purpose of conveying more information and clearly indicate the source. If media or individuals who do not want to be reproduced can contact us, which will be deleted.
Integrated Circuits
Discrete Components
Connectors & Structural Components
Assembly UnitModules & Accessories
Power Supplies & Power Modules
Electronic Materials
Instrumentation & Test Kit
Electrical Tools & Materials
Mechatronics
Processing & Customization
