Silicon Photonics and PIC Testing
■ Luna's unique test systems, based on optical frequency-domain reflectometry (OFDR), deliver accuracy and speed for testing modern integrated optical components.
■ "See Inside" Components with 10 pm Resolution Luna's ultra-high resolution reflectometers offer backscatter-level sensitivity for unprecedented distributed loss analysis of passive components.
■Complete Component Characterization with Single Instrument Luna’s Optical Vector Analyzer (OVA) measures a passive component’s linear transfer function (Jones Matrix) with a single scan, yielding insertion loss (IL), group delay (GD), chromatic dispersion (CD), polarization mode dispersion (PMD), polarization dependent loss (PDL), and other critical parameters.
■Lightwave Component Analyzer for High-Speed Manufacturing Test The Luna 6415 combines high-speed and high-resolution reflectometer measurements with the ability to also analyze IL in transmission, making it ideal for high-throughput manufacturing test and quality control.
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Optical Vector Analyzer 、 Optical Backscatter Reflectometer 、 Lightwave Component Analyzer |
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[ Manufacturing test ][ Quality control ][ Diagnose production issues ][ Characterize design ][ analyze design ][ Validate models ][ improve simulations ][ Passive optical components ][ modules - filters ][ PLCs ][ AWGs ][ MUX/DEMUX ][ splitters ][ gratings ][ WSS ][ ROADMs, ] |
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Datasheet |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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2021/6/2 |
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363 KB |
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