OVA 5000: The Standard for Optical Component T&D
●A single scan measures the component’s linear transfer function (Jones Matrix). From these data, insertion loss (IL), group delay (GD), chromatic dispersion (CD), polarization mode dispersion (PMD), polarization dependent loss (PDL), and other linear parameters can be calculated.
■Get Reflectometer Capability with the OFDR Option
●Two great instruments in one. Measure reflective events over lengths up to 75 meters with 20 μm resolution and a noise floor of -95dB.
■No Need for Tedious Polarization Alignment
●The standard OVA 5000 software scans across all polarization states. The polarization analysis software (PAS) option allows polarization dependent device and characterization.
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Application note & Design Guide |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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2016/3/18 |
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627 KB |
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