Designing a Double-Pulse Test (DPT) System ARTICLE REPRINT

PublishTime：2020-11-20

When evaluating power transistors for your power converter design, it is important to choose the right device for your application. Ideally, datasheets from power semiconductor suppliers would provide consistent results enabling engineers to compare dynamic parameters. For dynamic switching characteristics, this is easier said than done.
A standard test system designed to characterize wide-bandgap (WBG) power transistors must keep parasitics small and consistent from system to system. This article discusses important considerations when designing a standard DPT system used to correlate results between multiple test systems.

Brand of Product：	Keysight
Part#：
Product Category：	Double-Pulse Test System 、 power transistors More
Application：	More
Data Type：	Application note & Design Guide More
Safety & Environment Standards：	More
Operating Temperature：	Please see the document for details
Qualification Grade：	More
Qualification Approval：	More
Package：
Language：	English Chinese Chinese and English Japanese
Date of Creation：	August 10, 2020
Version Number：
Data Encoding：	7120-1239.EN
Data Size：	1.9 MB

Data section preview(2pages)

- The full preview is over. If you want to read the whole 5 page document,please Sign in/Register -

Download

+1 Like
Add to Favorites

Recommend

Technical Resources

More>

All reproduced articles on this site are for the purpose of conveying more information and clearly indicate the source. If media or individuals who do not want to be reproduced can contact us, which will be deleted.

Integrated Circuits