Double Pulse Test Results for the GS-065-0xx-1-L PDFNs

2021-12-30
The Double Pulse Test (DPT) is used to characterize the turn-onand turn-off characteristics of switching power transistors.
This document provides the following information
●An overview of the DPT setup
●DPT results for GaN Systems' PDFN E-HEMTS
■GS-065-004-1-L
■GS-065-008-1-L
■GS-065-011-1-L

GaN Systems

GS-065-0xx-1-LGS-065-004-1-LGS-065-008-1-LGS-065-011-1-L

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Part#

switching power transistors

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Application note & Design Guide

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English Chinese Chinese and English Japanese

December 2020

GSDN001

1.1 MB

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