TIPS & TRICKS ON DOUBLE PULSE TESTING Application Note
■In modern societies, a substantial amount of electrical energy is required for the operation of electronic circuits or controlled electrical drives. The requirement of electrical energy for these applications is fulfilled by power electronic converters. Power semiconductors (IGBT or MOSFET) are controlled devices,which are used to realize these converters. Even though the semiconductor industry has made a significant progress in the development of powerful and efficient components, power losses still occur in these components and cause them to heat up.
■The junction temperature of a semiconductor has to be kept below a maximum permissible limit. Furthermore, heating up and cooling down have a strong influence on the lifetime of a semiconductor device. This so-called “thermal cycling”is another important aspect for the design of a cooling system. In order to design an effective cooling system, it is necessary to know the power losses occurring during the operation of a circuit as precisely as possible. These losses are composed of conduction and switching losses. While the conduction losses can be measured relatively easily, this is not so easy for switching losses.
■Figure 1 depicts one phase of a typical two-level converter.During a fundamental cycle,the operation of the converter changes between buck and boost mode, depending on the direction of current flow. The switching operation of the converter creates commutation events from switch to diode or vice versa in each mode.If the converter operates in buck mode,S1 and D1 are active. In boost mode,the current commutates between S2 and D2. Consequently, a setup is required which allows the measurement of switching losses and switching times for all aforementioned commutations.Here the double pulse test comes into play.
■This application note describes the basic concept of double pulse testing, the necessary measurement setup and gives an overview of the parameters influencing the measurement. Furthermore, practical tips for carrying out the measurement are presented. At this point, the reader is referred to the software application included in the application note,which allows to easily perform double pulse tests with Rohde&Schwarz instruments.
|
R&S®RTO2000 、 R&S®RTE1000 、 R&S®RTA4000 、 R&S®RTM3000 、 R&S®HMF2550 |
|
|
|
|
|
Application note & Design Guide |
|
|
|
|
Please see the document for details |
|
|
|
|
|
|
|
|
|
|
|
English Chinese Chinese and English Japanese |
|
|
03.2021 |
|
|
Version 1.00 |
|
|
GFM347 |
|
|
2.8 MB |
- +1 Like
- Add to Favorites
Recommend
All reproduced articles on this site are for the purpose of conveying more information and clearly indicate the source. If media or individuals who do not want to be reproduced can contact us, which will be deleted.
Integrated Circuits
Discrete Components
Connectors & Structural Components
Assembly UnitModules & Accessories
Power Supplies & Power Modules
Electronic Materials
Instrumentation & Test Kit
Electrical Tools & Materials
Mechatronics
Processing & Customization
