ISL70419SEH Single Event Effects Testing TEST REPORT
The intense heavy ion environment encountered in space applications can cause a variety of transient and destructive effects in analog circuits, including single-event latch-up (SEL), single-event transients (SET) and single-event burnout (SEB). These effects can lead to system-level failures including disruption and permanent damage. For predictable and reliable system operation, these components have to be formally designed and fabricated for SEE hardness, followed by detailed SEE testing to validate the design. This report discusses the results of SEE testing of Intersil’s ISL70419SEH.
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Test Report |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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July 17, 2014 |
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Rev 0.00 |
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AN1944 |
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1.6 MB |
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