ISL70003SEH Single Event Effects Testing TEST REPORT
The intense heavy ion environment encountered in space applications can cause a variety of destructive and non destructive effects in analog circuits, including single event latch-up (SEL), single event gate rupture (SEGR), single event burnout (SEB), single event transients (SET) and single event functional interrupt (SEFI). These effects can lead to system-level failures including disruption and/or permanent damage. For predictable and reliable system operation, these components have to be formally designed and fabricated for SEE hardness, followed by detailed SEE testing to validate the design. This report discusses the results of SEE testing of Intersil’s ISL70003SEH, a wide input voltage range (3V to 13.2V) 6A synchronous buck regulator.
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radiation and SEE hardened synchronous buck regulator 、 synchronous buck regulator 、 highly integrated buck regulator |
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Test Report |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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March 2, 2015 |
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Rev 1.00 |
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AN1913 |
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1.6 MB |
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