ISL75051SRH Single Event Effects Testing of the ISL75051SRH LDO
This application note describes the Single Event Effects (SEE) tests performed on the ISL75051SRH to characterize its Single Event Burnout (SEB), Single Event Latch-up (SEL) and Single Event Transient (SET) sensitivity. The test facility was the Cyclotron at Texas A&M Radiation Effects Test laboratory.
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LDO 、 radiation hardened, low voltage, high current, single output LDO 、 evaluation board |
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Test Report |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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October 14, 2011 |
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Rev 0.00 |
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AN1666 |
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1.6 MB |
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