Agilent EEsof EDA A WLAN Test System using Test Equipment with EDA Software

PublishTime：2022-04-21

●Test measurements such as EVM and ORFS for transmission tests as well as Minimum Input Level Sensitivity and Adjacent Channel Rejection for receiving tests are required by WLAN (Wireless Local Area Network) standards. For such complex tests it is hard to find a system on the market to meet the requirements. A pure hardware test solution consisting of connecting a number of test instruments such as signal generators, channel emulators, interference generators, signal analyzers, and receiver testers is very expensive and difficult to be configured to meet the standard. Although some virtual analyzers in the current market can extend functionality for some basic test equipment this is not enough to meet the requirements for this type of complex testing. This article describes a test system configured from basic hardware test equipment: A signal generator and vector signal analyzer, connected with EDA software for testing WLAN systems based on the IEEE 802.11a/g standard. Results show that the connected hardware/software system works very well.
●Introduction
■Demand for WLAN systems is growing very fast within the worldwide wireless communications industry. New WLAN systems based on the IEEE 802.11a/g standards deliver higher data rates, better spectral efficiency, improved performance under multi-path fading conditions, and less interference in low-mobility wireless conditions than earlier systems. WLAN systems are widely used for wireless network connection.
■To support high-rate data in the systems multi-carrier modulation, orthogonal frequency division multiplex (OFDM) is used. The basics of OFDM [1] is to split a high data rate stream into a number of lower rate streams that are transmitted, simultaneously, over several subcarriers. With lower data rates in the parallel subcarriers there is increased symbol duration decreasing the relative amount of dispersion in time (delay spread)caused by multi-path propagation. Inter-symbol interference (ISI) can be reduced significantly because an adequate guard interval can be inserted between successive OFDM symbols.
■In practice, components such as power amplifiers (PAs) in WLAN should be chosen based on low cost. On the other hand the effects of non-linear distortion must be considered very carefully because the OFDM system is very sensitive to it. So for both R&D and manufacturing phases the WLAN system must be tested and verified by using measurements to see the system meets the requirements of the IEEE standards. The tests must include measurements such as Error Vector Magnitude (EVM), Complementary Cumulative Distribution Function (CCDF), and Output RF Spectrum with Mask (ORFS),to test and verify key components such as the PA. For receiver tests, bit error rate (BER),packet error rate (PER), minimum input level sensitivity, and adjacent channel rejection are required.

Brand of Product：	Keysight
Part#：
Product Category：	EDA Software More
Application：	[ WLAN Test system ] More
Data Type：	Technical Documentation More
Safety & Environment Standards：	More
Operating Temperature：	Please see the document for details
Qualification Grade：	More
Qualification Approval：	More
Package：
Language：	English Chinese Chinese and English Japanese
Date of Creation：	May 05, 2003
Version Number：
Data Encoding：	5989-9033EN
Data Size：	674 KB

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