SMART ZDIMMs for AI and ML
●Using highly reliable DRAM memory for AI and ML applications is extremely critical. If there are too many memory ECC errors or other catastrophic DRAM bit failure issues this will cause a system shutdown and the entire training job needs to be restarted. This problem can be extremely costly and take significant time to recover. One solution used widely today to mitigate against memory failures is having redundant computing systems that mirror the AI and ML functions. As one can imagine that this is extremely costly.
●A new cost-optimized and highly effective solution is to use SMART’s high reliability ZDIMMs. ZDIMMs (Zefr Memory Modules) are rigorously tested to eliminate over 90% of memory reliability failures, ensuring maximum application uptime and optimizing memory subsystem reliability.
SRZAG8RD5846-SB 、 SRZHG8RD5648-SP 、 SRZ8G8RD5448-SP 、 SRZ4G8RD5448-SP 、 SRZ4G8RD5288-SP 、 SRZ8197RD440425-SC 、 SRZ4097RD440425-SC 、 SRZ4097RD420825-SC 、 SRZ2047RD410825-SE |
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[ AI ][ ML ][ Natural language processing ][ LLMs ][ Image recognition ][ 3D rendering ][ security camera data processing ][ DNA Sequencing ][ high resolution medical image processing ][ Algorithmic trading ][ real time high-speed analytics ] |
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Supplier and Product Introduction |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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10.06.24 |
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Rev.6 |
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1.6 MB |
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