SMART DIMM Reliability Equates to Test
●Phase 1: ATE - Automated Test Equipment
■Industry standard test platform for testing high volumes in factory environment. Very effective at finding high level defects.
■DC parametric testing
▲Continuity, Shorts, Input/output leakage, power
■AC functional tests
▲Mode (check basic read/write, DM)
▲Timing (broad range of March tests)
▲Data patterns
▲VDD/VREF (low/nominal/high – with margin)
▲Data retention (extensive testing)
●Phase 2: SLT - System Level Testing
■Finds defects by testing in an application environment
▲Testing in a motherboard cannot be replicated with ATE
■SLT performed on Intel based motherboards
▲High memory utilization (<2% idle time)
▲Full rated module speed (DDR4-3200)
■Failures identified include:
▲No boot
▲Single and multibit ECC
▲Performance / speed
▲Weal DRAM cells
■SMART performs 100% ATE test AND 100% System Level Test (SLT)
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Datasheet |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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09.24.22 |
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Rev.2 |
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812 KB |
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