SMART DIMM Reliability Equates to Test

PublishTime：2022-10-17

●With its advanced testing services that include the combination of ATE and system testing SMART offers high reliability modules targeted for mission-critical applications. By testing all the module circuitry and its components as well as how the assembled modules function at full speed operation in a system this method offer proven reliabillity.
●Phase 1: ATE - Automated Test Equipment
■Industry standard test platform for testing high volumes in factory environment. Very effective at finding high level defects.
■DC parametric testing
▲Continuity, Shorts, Input/output leakage, power
■AC functional tests
▲Mode (check basic read/write, DM)
▲Timing (broad range of March tests)
▲Data patterns
▲VDD/VREF (low/nominal/high – with margin)
▲Data retention (extensive testing)
●Phase 2: SLT - System Level Testing
■Finds defects by testing in an application environment
▲Testing in a motherboard cannot be replicated with ATE
■SLT performed on Intel based motherboards
▲High memory utilization (<2% idle time)
▲Full rated module speed (DDR4-3200)
■Failures identified include:
▲No boot
▲Single and multibit ECC
▲Performance / speed
▲Weal DRAM cells
■SMART performs 100% ATE test AND 100% System Level Test (SLT)

Brand of Product：	SMART
Part#：
Product Category：	SMART DIMM More
Application：	More
Data Type：	Datasheet More
Safety & Environment Standards：	More
Operating Temperature：	Please see the document for details
Qualification Grade：	More
Qualification Approval：	More
Package：
Language：	English Chinese Chinese and English Japanese
Date of Creation：	09.24.22
Version Number：	Rev.2
Data Encoding：
Data Size：	812 KB

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