SMART DIMM Reliability Equates to Test
Phase 1: ATE - Automated Test Equipment Phase 2: SLT - System Level Testing
With its advanced testing services that include the combination of ATE and system testing SMART offers high reliability modules
targeted for mission-critical applications. By testing all the module circuitry and its components as well as how the assembled
modules function at full speed operation in a system this method offer proven reliabillity.
For more information, please visit: www.smartm.com
Customer Service:
T: (+1) 510-623-1231 • E: customers@smartm.com
Headquarters/North America:
T: (+1) 800-956-7627 • T: (+1) 510-623-1231
F: (+1) 510-623-1434 • E: info@smartm.com
Latin America:
T: (+55) 11 4417-7200 • E: sales.br@smartm.com
EMEA:
T: (+44) 0 7826-064-745 • E: sales.euro@smartm.com
Asia/Pacific:
T: (+65) 6678-7670 • E: sales.asia@smartm.com
©2022, SMART Modular Technologies, All rights reserved. The stylized “S” in conjunction with “SMART”, as well as “SMART Modular Technologies” are registered trademarks of SMART Modular Technologies. All other trademarks are
the property of the respective owners. These materials are provided by SMART Modular Technologies as a service to its customers and may only be used for informational purposes. 09.24.22/2Phase_Module_Testing/Rev.2
•
Industry standard test platform for testing high volumes
in factory environment. Very effective at finding high
level defects.
•
DC parametric testing
• Continuity, Shorts, Input/output
leakage, power
•
AC functional tests
• Mode (check basic read/write, DM)
• Timing (broad range of March tests)
• Data patterns
• VDD/VREF (low/nominal/high – with margin)
• Data retention (extensive testing)
•
Finds defects by testing in an application environment
• Testing in a motherboard cannot be replicated with ATE
•
SLT performed on Intel based motherboards
• High memory utilization (<2% idle time)
• Full rated module speed (DDR4-3200)
•
Failures identified include:
• No boot
• Single and multibit ECC
• Performance / speed
• Weal DRAM cells
•
SMART performs 100% ATE test
AND 100% System Level Test (SLT)
Memory Modules
Temperature
Load
Speed
Time
Latent Defect
Memory Modules
!