HCS 10 SPECIFICATIONS

2024-10-12
●The HCS 10 System is a high-end Hall-Characterization system, working according to the well- known Van-der-Pauw technique. It can not only be used for DC, but also for AC Hall experiments (in combination with an integrated Lock-In Amplifier) in order to expand the measurement range to a maximum, and thus cover a range of materials as broad as possible. The system can be used to characterize various materials including Si, SiGe, SiC, GaAs, InGaAs, InP, GaN (N Type & P Type can be measured), metal layers, oxides and many more.
●It measures: Electrical Conductivity / Resistivity, Hall-Constant, Charge Carrier Concentration and Hall-Mobility. An optional Seebeck Coefficient measurement stage is available as extension kit.

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HCS 10

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high-end Hall-Characterization system

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2024/8/7

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