HCS 1 SPECIFICATIONS

2024-10-12
●The Linseis HCS 1 System with high performance permanent magnets allows the characterization of metal and semiconducting samples according to the well-known Van-der-Pauw technique. It measures: Electrical Conductivity / Resistivity, Hall-Constant, Charge Carrier Concentration and Hall-Mobility. An optional Seebeck Coefficient measurement stage is available as extension kit. The system can be used to characterize various materials including Si, SiGe, SiC, GaAs, InGaAs, InP, GaN (N Type & P Type can be measured), metal layers, oxides and many more.

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HCS 1

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2024/8/7

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