MIL-PRF-19500P Method EX Certification & Qualification Plans

2024-03-22
■EX Certification
●Certification 100% Testing
◆MIL-PRF-19500P Appendix E
◆Table E-IV - Screening Requirements
●Test Sample
◆Die visual For Glass Diodes
◆Internal visual
◆High Temperature Life Nonoperating Life
◆Temperature Cycling
◆Surge (as specified)
◆Thermal Impedance (as specified)
◆Constant Acceleration
◆PIND
◆Instability Shock Test
◆Hermetic Seal F&G
◆Serialization
◆Interim Electrical Parameters
◆HTRB 24 Hours
◆Interim Electrical Parameters As Specified For Device Type
◆Burn-in 160 Hours
◆Final Electrical Parameters As Specified For Device Type
◆Hermetic Seal F&G
◆Radiography
◆External Visual Examination
◆Case Isolation
●Size
◆Optional
◆100%
◆100%
◆100%
◆100%
◆100%
◆100%
◆100%
◆100%
◆100%
●MIL-STD-750 Method
◆1032
◆1051
◆1039 Condition A
◆1039 Condition B
◆1071

Central Semiconductor

MIL-PRF-19500P

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Test Report

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2022/5/17

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