MODEL 3380P VLSI TEST SYSTEM
●The 3380D/3380P/3380 test systems have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
●The test system 3380P also has built in all-in-one design (for test head only) to provide a small footprint/clear power ATE to become a very competitive price/performance ratio test system.
●KEY FEATURES
■50/100 MHz clock rate
■ 50/100 Mbps data rate
■ 512 digital I/O pins (channels)(Max 576 digital I/O pins)
■ Up to 512 sites parallel testing
■ 32/64/128M pattern memory
■ 16M capture memory per pin
■ Various VI source
■ Flexible HW-architecture(Interchangeable I/O, VI, ADDA)
■ Real parallel trim/match function
■ Time & Frequency Measurement Unit(TFMU)
■ AD/DA test (16/24 bits option)
■ SCAN test option (max. 2G bits/chain)
■ ALPG test option for embedded memory
■ STDF tools support
■ Test program/pattern converter(J750, D10, S50, E320, SC312, V7, TRI-6836)
■ Direct mount probe card is compatible with 3360P/3380D direct mount probe card (only 256pins)
■ Cable mount DUT card is compatible with 3360D/3360P/3380D cable mount DUT card (FT/CP)
■ CRAFT C/C++ programming language Software is compatible with 3360/3360P
■ User friendly Windows 7 / Windows 10 environment
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Datasheet |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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202307 |
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3380P-EN-202307 |
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2.9 MB |
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