MODEL 3380P VLSI TEST SYSTEM

2020-11-23
In order to cope with the IC testing trend of high-speed, numerous pins and complex functions in the future, the newest generation of Chroma's VLSI test systems, 3380D/3380P/3380, have adopted a more flexible architecture with higher integration density and powerful functions.
The 3380D/3380P/3380 test systems have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
The test system 3380P also has built in all-in-one design (for test head only) to provide a small footprint/clear power ATE to become a very competitive price/performance ratio test system.

CHROMA

MODEL 3380P3380D3380

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VLSI TEST SYSTEM

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