MODEL 3380P VLSI TEST SYSTEM
The 3380D/3380P/3380 test systems have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
The test system 3380P also has built in all-in-one design (for test head only) to provide a small footprint/clear power ATE to become a very competitive price/performance ratio test system.
MODEL 3380P 、 3380D 、 3380 |
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Datasheet |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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202001 |
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918 KB |
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