Current Leakage through Ceramic Capacitors
■Two colleagues measuring on the same test setup, using the same measurement instrument, and measuring at identical temperatures find two different power-down currents. How is that possible? The code executing on the devices is identical, but still, the two colleagues constantly measure a difference of approximately 500 nA. The answer to this difference is the timing aspect of the measurements. One of the colleagues measured the power-down current 250 ms after power-on, whereas the other colleague measured the power-down current long after the device had been powered on. The measurement conducted 250 ms after power-on showed the highest of the current consumptions. This discovery led to some debug work, and eventually, it was found that the current consumption difference was due to time-dependent current leakage through the bulk-decoupling capacitors used in the test setup. And this discovery is the reason for this application note, because how does current leak through ceramic capacitors?
●KEY POINTS
■The amount of capacitance and capacitor construction material affect leakage current.
■Current consumption measurements can only be compared if they are conducted at the same point in time relative to the power-on event of the circuit.
■A larger capacitance has a larger leakage current compared to a small capacitance.
■Capacitor package size does not significantly influence the magnitude of the leakage through the capacitor.
■Leakage through a ceramic capacitor can be described by a power function and follows a straight line in a log-log plot.
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Application note & Design Guide |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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April 2023 |
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Rev. 1.0 |
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10.7 MB |
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