MCM-11326：Active Second Source Wafer Fab Foundry Corbeil & Probing Site Corbeil [MLX81115]
■Type of change
●Move of all or part of electrical wafer test and/or final test to a different test site.
■Description of change
●Old Electrical wafer test location: MLX Kuching (Sarawak / Malaysia)
●New Electrical wafer test location: MLX Kuching (Sarawak / Malaysia) + Melexis Corbeil (France / Europe)
■Marking of parts / traceability of change
●Lots produced at X-fab Corbeil will have a different lot ID-number. The first letter of the lot ID will start with "F". Traceability ensured by lot number and datecode through the Melexis ERP system.
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PCN/EOL |
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Please see the document for details |
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DFN_WF12/4x4 GR |
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English Chinese Chinese and English Japanese |
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08-Feb-2023 |
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MCM-11326 |
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5.2 MB |
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April 2023 |
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Move of all or part of electrical wafer test and/or final test to a different test site |
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