High Temperature Analog to Digital Converter Reliability Testing
●Component drift over time and temperature cycling are therefore just as important to know/predict as time-zero accuracy
●Parametric shifts affecting post-compensation accuracy are presented for a 12-bit ADC from samples stressed by 250°C bias plus temperature cycling from -65°C to 200°C
●Mechanical / Assembly data is also presented
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Test Report |
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Please see the document for details |
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DIP |
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English Chinese Chinese and English Japanese |
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2021/6/15 |
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