High Temperature Analog to Digital Converter Reliability Testing

2022-11-18
●It is common practice to characterize and compensate initial measurement errors in down-hole tools
●Component drift over time and temperature cycling are therefore just as important to know/predict as time-zero accuracy
●Parametric shifts affecting post-compensation accuracy are presented for a 12-bit ADC from samples stressed by 250°C bias plus temperature cycling from -65°C to 200°C
●Mechanical / Assembly data is also presented

Honeywell

HTADC12

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Part#

Analog to Digital Converter12-Bit ADC

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Test Report

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Please see the document for details

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DIP

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2021/6/15

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