Single Event Effects Testing of the ISL75051SRH LDO
This application note describes the Single Event Effects (SEE) tests performed on the ISL75051SRH to characterize its Single Event Burnout (SEB), Single Event Latch-up (SEL) and Single Event Transient (SET) sensitivity. The test facility was the Cyclotron at Texas A&M Radiation Effects Test laboratory.
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Application note & Design Guide |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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October 14, 2011 |
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AN1666.0 |
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Application Note 1666 |
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1.3 MB |
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