Single Event Effects (SEE) Testing of the ISL70219ASEH Dual Operational Amplifier
●Introduction
■The intense proton and heavy ion environment encountered in space applications can cause a variety of single-event effects (SEE) in electronic circuitry, including single event upset (SEU), single event transient (SET), single event functional Interrupt (SEFI) and single event burnout (SEB). SEE can lead to system level performance issues including disruption, degradation and destruction. For predictable and reliable space system operation, individual electronic components should be characterized to determine their SEE response. This report discusses the results of SEE testing performed on the ISL70219ASEH dual operational amplifier.
■Throughout this document reference is made to linear energy transfer (LET) and the units of this parameter is always understood to be MeV•cm²/mg.
●Product Description
■The ISL70219ASEH is a dual version of the ISL70419SEH quad high performance operational amplifier and is fabricated in Intersil's 40V bonded wafer SOI process with deep trench isolation for precision bipolar analog products. The ISL70219ASEH is a metal variation of the ISL70419SEH die that only connects two of the four amplifiers on the die. Consequently, the ISL70219ASEH is identical in silicon to two of the ISL70419SEH amplifiers.
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Dual Operational Amplifier 、 quad high performance operational amplifier |
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Test Report |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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October 24, 2014 |
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TR002.0 |
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Test Report 002 |
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557 KB |
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