N32G032F6U7 可靠性试验报告 (IC201013-024) (N32G032F6U7Reliability Test Report) (IC201013-024)
●Purpose: Perform the product qualification reliability test for Nationz Technologies Inc
●可靠性试验:
●Reliability Test:
■样品信息:
■Sample Information:
■产品型号: N32G032F6U7
■Part No.: N32G032F6U7
■产品批号: AAI036N010
■Lot No.: AAI036N010
■封装形式: QFN 3X3X0.55 20
■Package Type: QFN 3X3X0.55 20
■试验数量: 308
■Sample Size: 308
●材料厂商/型号
●Raw Material Supplier/Model
■材料名称
■Material Name
▲引线框架: QFNWB3X3-20L-R(COL)(1 block)(RT-321)
▲L/F: QFNWB3X3-20L-R(COL)(1 block)(RT-321)
▲焊线: Auφ20
▲Wire: Auφ20
▲料饼CEL-9220HF
▲Compound: CEL-9220HF.
▲粘胶: 760L2
▲Bonding Materia: 760L2
▲芯片尺寸: 2.158*2.095
▲Chip Size: 2.158*2.095
●试验环境条件Test Environment Conditions
●Test Environment Conditions
■温度: 23.5°C~24.1°C;
■Temp.: 23.5°C~24.1°C;
■湿度: 53.8%RH~70.1%RH
■Humi.: 53.8%RH~70.1%RH
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Test Report |
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Please see the document for details |
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QFN |
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English Chinese Chinese and English Japanese |
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2020/12/18 |
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Rev. No.:2 |
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IC201013-024;JCET-SP-QA-RA210028-R002 |
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1.9 MB |
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