N32G030K6L7/N32G030K8L7 ELECTROSTATIC DISCHARGE (ESD) TESTING REPORT (S210319134)
●Product: N32G030K6L7/N32G030K8L7
●Case NO: S210319134
●Quantity: 3 ea
●Test Item: Latch-up (LU)
●Package/Pin Count: LQFP32
●Application Date: 2021/3/19
●Date Finished: 2021/3/30
●Reference: ESDA/JEDEC JS-002-2018
●Temperature: 25 ± 5 °C
●Humidity: 55 ± 5%
●Test Instrument: Orion(SN1612241)
●Calibiration Due Date: 2020/08/31~2021/08/30
●Test Voltage: ±1000V
●Failure Criteria: compliance within 10% V+I envelope around REFERENCE I-V curve (pre-zap) and CustomerFunction Test.
●ESD Testing Result: Minimum Pass Level = ±1000V
●NOTE 1:
■ESD/latch-up test is employed as one of qualification tests for electronic products. However, the pass / fail results of this test can NOT be taken as go/no-go criteria for IC tape-out and mass production. Before and after ESD/latch-up test(s),complete parametric and functional testing (F/T) are essential for determining pass/fail of the tested products.
●NOTE 2:
■MA-tek sample storage policy is 14 days after the test data delivery. Prolonged storage can be arranged per client's request.
●WE HEREBY CERTIFY THAT:
■The test(s) was/were conducted according to test conditions provided by customer. Testing was performed on calibrated and JEDEC-ESDA qualified ESD instruments. The quality and comprehensiveness of this test(s) were delivered by qualified personnel.
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Test Report |
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Please see the document for details |
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LQFP32 |
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English Chinese Chinese and English Japanese |
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2021/3/30 |
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S210319134 |
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650 KB |
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