N32G030K6L7/N32G030K8L7 ELECTRICAL OVER STRESS (EOS) TESTING REPORT (S210319134)

PublishTime：2022-04-26

●Applicant/Department: Nations Technologies Inc.
●Product: N32G030K6L7/N32G030K8L7
●Case NO: S201221072
●Quantity: 3 ea
●Test Item: Electrical Over Stress (EOS)
●Package/Pin Count: LQFP32
●Application Date: 2021/3/19
●Date Finished: 2021/3/30
●Reference: IEC 61000-4-5
●Temperature: 25 ± 5 °C
●Humidity: 55 ± 5%
●Test Instrument: EOS, TVS8/20TC
●Test Voltage: +8V
●Failure Criteria: compliance within 10% V+I envelope around REFERENCE I-V curve (pre-zap) and Customer Function Test.
●EOS Testing Result: Minimum Pass Level = +8V
●NOTE 1:
■MA-tek sample storage policy is 14 days after the test data delivery. Prolonged storage can be arranged per client's request.
●WE HEREBY CERTIFY THAT:
■The test(s) was/were conducted according to test conditions provided by customer. Testing was performed on calibrated and JEDEC-ESDA qualified ESD instruments. The quality and comprehensiveness of this test(s) were delivered by qualified personnel.

Brand of Product：	Nations
Part#：	N32G030K6L7 、 N32G030K8L7 More Part#
Product Category：	More
Application：	More
Data Type：	Test Report More
Safety & Environment Standards：	More
Operating Temperature：	Please see the document for details
Qualification Grade：	More
Qualification Approval：	More
Package：	LQFP32
Language：	English Chinese Chinese and English Japanese
Date of Creation：	2021/3/30
Version Number：	Ver:A
Data Encoding：	S210319134
Data Size：	704 KB

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