BFR391 Silicon NPN Planar RF Transistor Reliability Report
●CONTENTS:
■Certificate of Conformance
■Process Flow Chart + Mechanical Test Results
■DC Static Test Results:
▲Post Seal at 25°C
▲Post Stabilization Bake at -55°C, 25°C, 125°C
▲Post Acceleration at -55°C, 25°C, 125°C
▲Post HTRB at -55°C, 25°C, 125°C, Delta
▲Post Burn-In at -55°C, 25°C, 125°C, Delta
▲Post Steady-State Life Test at -55°C, 25°C, 125°C, Delta
■Dynamic Test Results:
▲Post Seal at 25°C
▲Post Stabilization Bake at 25°C
▲Post HTRB at 25°C
▲Post Burn-In at 25°C
▲Post Steady-State Life Test at 25°C
■Material Analysis:
▲Scanning Electron Microscopy (SEM) including WLAT
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Test Report |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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8/18/2020 |
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7.3 MB |
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