2SC3356 Silicon NPN Planar RF Transistor Reliability Report
●CONTENTS:
■Certificate of Conformance
■Process Flow Chart + Mechanical Test Results
■DC Static Test Results:
▲Post Stabilization Bake at -55°C, 25°C, 125°C
▲Post Acceleration at -55°C, 25°C, 125°C
▲Post HTRB at -55°C, 25°C, 125°C
▲Post Burn-In at -55°C, 25°C, 125°C
▲Interim 250 hours & 500 hours Steady-State Life Test at 25°C
▲Post Steady-State Life Test at -55°C, 25°C, 125°C
▲Scanning Electron Microscopy (SEM) analysis including WLAT
■Dynamic Test Results:
▲Preliminary at 25°C
▲Post Stabilization Bake at 25°C
▲Post Burn-In at 25°C
▲Post Steady-State Life Test at 25°C
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Test Report |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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7/15/2020 |
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5.8 MB |
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