High Voltage GaN Switch Reliability: Calculation of FIT rates and PPM reliability based on existing JEDEC, AEC and ZVEI Standards
●Transphorm has created a body of reliability data across multiple generations of products that demonstrate the robustness of their platform; by extensive qualification testing, testing to device failure, and by having an in depth understanding of failure modes and acceleration factors.
●There are a set of comprehensive standards to provide guidance to producers and users of wide band gap devices to determine if product reliability will meet application reliability requirements. These standards are not “new” and are routinely used in the automotive industry and by extension to commercial applications to determine product lifetime and robustness[3]-[8]. By properly applying these standards to develop reliability tests and making the data readily available one can provide assurance that products being produced will meet the reliability requirements of commercial and automotive applications.
●In this paper will discuss the application of accelerated life test data to determine the intrinsic and extrinsic failure rates of a commercially available automotive qualified GaN device from Transphorm.
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Technical Documentation |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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November 2018 |
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757 KB |
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