GaN Switching Loss Simulation using LTSpice

PublishTime：2021-12-30

●GaN Systems provides Pspice/LTSpice simulation models for GaN Enhancement mode HEMT.
●In this presentation, a half bridge double pulse test circuit in LTSpice is introduced and used as the test bench to evaluate switching performance under different electrical parameters.
●Switching losses were simulated and compared with Lab measurement

Brand of Product：	GaN Systems
Part#：	GS66508T More Part#
Product Category：	More
Application：	More
Data Type：	Solutions More
Safety & Environment Standards：	More
Operating Temperature：	Please see the document for details
Qualification Grade：	More
Qualification Approval：	More
Package：
Language：	English Chinese Chinese and English Japanese
Date of Creation：	July 20, 2021
Version Number：
Data Encoding：
Data Size：	871 KB

Data section preview(2pages)

- The full preview is over. If you want to read the whole 11 page document,please Sign in/Register -

Download

+1 Like
Add to Favorites

Recommend

Technical Resources

More>

All reproduced articles on this site are for the purpose of conveying more information and clearly indicate the source. If media or individuals who do not want to be reproduced can contact us, which will be deleted.

Integrated Circuits