E4727B Advanced Low-Frequency Noise Analyzer
◆1/f noise corner frequency measurement in very high frequency
◆Extremely low device noise measurement such as transistor linear region noise by newly designed LNA
◆State of the art new LNA also allows noise measurement in very low bias current
◆High power device noise measurement even in the high current like 1A
◆Improve measurement productivities by fast measurement speed even in the high accurate condition with number of averaging.
[ Process design kit development ][ Manufacturing statistical process control ][ IC noise specification ][ Manufacturing statistical process reliability ] |
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Datasheet |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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August , 2020 |
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3120-1434.EN |
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336 KB |
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