E4727A /E4727P3 Advanced Low-Frequency Noise Analyzer/Measurement Bundle Software E4727E3 WGFMU Measurement Bundle Software DATA SHEET
Electrical noise is inherent in every circuit and may be caused by current flowing through a resistor or transistor, or even leakage current through a tantalum capacitor. As a classical limitation of electronics, this noise must be managed. A systems engineer must understand overall system sensitivity to noise, and then derive the key contributors. A typical key contributor might be a component like a semiconductor device, sensor or passive component. How do we quantify the noise of these constituent parts? The Keysight E4727A Advanced Low-Frequency Noise Analyzer (A-LFNA) enables a closer, deeper look at noise in components, individual devices and integrated circuits, both packaged and at the wafer level. A device modeling engineer may now leverage the A-LFNA’s rare combination of industry-leading noise sensitivity (–183 dBV2/Hz) to characterize devices at high voltages (to 200 V) and down to ultra-low frequencies (to 0.03 Hz). Thanks to seamless integration with WaferPro Express software, one may program and sequence high-speed DC, capacitance and RF measurements, all the while automating wafer prober control using Cascade Microtech’s software API.
The applications for wafer-level 1/f noise measurements are numerous; however, a few important ones are listed as follows.
–Process design kit development. Semiconductor device foundries enable fabless design centers to design components such as transceivers for mobile phones, frequency synthesizers, analog-to-digital converters and much more. To make this possible, the foundries must provide Process Design Kits (PDK’s) with simulation models of the primitive devices. The simulation models must include noise effects on transistors (BJT, CMOS, etc.) and resistors. The noise models must be across all possible bias currents, temperatures and device geometries.
–Manufacturing statistical process control and reliability. As an example, manufacturers of GaN devices may use noise measurements across their wafers as an early indicator of device reliability. Those devices that exhibit more noise are likely to fail sooner. Now we have a nondestructive way of assessing reliability, quite in contrast with standard accelerated life testing. Furthermore, for circuit applications where noise is a critical parameter, wafer level measurements may be used to track the evolution of noise performance across days, weeks and months of manufacturing.
–IC noise specification. Integrated circuit manufacturers of operational amplifiers and linear voltage regulators often need to characterize input referred voltage noise as a critical specification in their datasheets. One wafer may contain 20,000 such circuits. To efficiently measure and map circuit performance across the wafer (and even across lots of wafers), the probe and signal conditioning circuitry must be placed close to the device under test to improve grounding and minimize external noise influences.
|
E4727E3 、 E4727A 、 E4727P3 、 M9018A 、 4142B 、 4155 、 4156 、 B1500 、 E5260 、 E5270 、 41420A 、 41421B 、 4155B 、 4155C 、 4156B 、 4156C 、 B1500A 、 B1510A 、 B1511A 、 B1511B 、 B1517A 、 E5260A 、 E5290A 、 E5291A 、 E5270B 、 E5280B 、 E5281B 、 E5287A 、 E4727A-022 、 E4727A-023 、 E4727A-031 、 E9000S 、 R-35E-001-B 、 R-36E-002-L 、 R-36E-002-X 、 R-36E-002-Y 、 B1500A-A00 、 B1500A-A30 、 B1500A-A31 、 B1500A-A3P 、 R-35E-001-A 、 R-36E-001-L 、 R-36E-001-X 、 R-36E-001-Y 、 M9036A 、 B1530A 、 82357B |
|
|
Advanced Low-Frequency Noise Analyzer 、 Measurement Bundle Software 、 WGFMU Measurement Bundle Software |
|
|
|
|
|
Datasheet |
|
|
|
|
Please see the document for details |
|
|
|
|
|
|
|
|
|
|
|
English Chinese Chinese and English Japanese |
|
|
September 28, 2018 |
|
|
|
|
|
5991-4280EN |
|
|
4.7 MB |
- +1 Like
- Add to Favorites
Recommend
- Keysight E4727B Advanced Low-Frequency Noise Analyzer Adopted by Samsung Foundry
- Keysight Technologies Acquires Quantum Benchmar, Augmenting Keysight‘s Quantum Portfolio
- Keysight First to Gain OmniAir Qualified Test Equipment Status, Accelerating C-V2X Device Certification
- Keysight First to Gain GCF Approval of Cases for Validating 5G New Radio mmWave Devices in Standalone Mode
- Keysight Massively Parallel Board Test System Selected by LACROIX in Automotive Printed Circuit Board Manufacturing
- Keysight, TIM and JMA Wireless Join Forces to Showcase O-RAN Technology at Mobile World Congress 2021
- Keysight, Xilinx and Cisco Showcase Solutions that Support Smooth Migration from 4G LTE Networks to 5G Open RAN
- Keysight Unveils the First Media Access Control Security Test Solution for High Speed Ethernet
All reproduced articles on this site are for the purpose of conveying more information and clearly indicate the source. If media or individuals who do not want to be reproduced can contact us, which will be deleted.
Integrated Circuits
Discrete Components
Connectors & Structural Components
Assembly UnitModules & Accessories
Power Supplies & Power Modules
Electronic Materials
Instrumentation & Test Kit
Electrical Tools & Materials
Mechatronics
Processing & Customization
