Radiation Tolerant Kintex UltraScale XQRKU060 FPGA Data Sheet
■The radiation tolerant (RT) XQR UltraScale™ architecture-based devices extend the benefit of commercial silicon with unique ceramic column grid array package, tested to stringent qualification flows like Xilinx® class B, class Y test flows (QML compliant), full M-grade operating temperature range support, and radiation tested for single-event effects.
■XQR Kintex® UltraScale FPGAs are high-performance monolithic FPGAs with a focus on performance. High DSP and block RAM-to-logic ratios and next-generation transceivers combined with space-grade packaging to handle vibration and handling requirements during launch and operation enable a new generation of high-density FPGAs for on-orbit reconfiguration, targeted for applications like on-board processing, digital payloads, remote sensing, and many more. The Xilinx Space Secure Site provides access to design guidelines and resources specific to space applications.
■This data sheet is part of an overall set of documentation on the UltraScale architecture-based devices available on the Xilinx website at www.xilinx.com/documentation.
●Summary of Radiation Characteristics for Kintex UltraScale XQRKU060 Devices:
■This product is intended for use in space environments and offered in Xilinx class Y, class B manufacturing and process flows. Xilinx 20 nm UltraScale device technology is developed with innovative configuration memory and block RAM design for single-event upset (SEU) mitigation, with optimized SEU design rules and strategic implementation of SEU enhanced cells. The Kintex UltraScale XQRKU060 device uses more than 40 proprietary, patented circuit design and layout techniques to reduce the SEU cross-section. Block RAM includes embedded error detection and correction (EDAC) for high-performance SEU mitigation.
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Datasheet |
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Please see the document for details |
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CNA1509 |
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English Chinese Chinese and English Japanese |
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December 17, 2020 |
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v1.2 |
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DS882 |
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2.7 MB |
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