ISL70040SEH, ISL73040SEH Single Event Effects (SEE) Testing TEST REPORT

PublishTime：2020-12-17

The intense proton and heavy ion environment encountered in space applications can cause a variety of Single Event Effects (SEE) in electronic circuitry, including Single Event Upset (SEU), Single Event Transient (SET), Single Event Functional Interrupt (SEFI), Single Event Gate Rupture (SEGR), and Single Event Burnout (SEB). SEE can lead to system-level performance issues including disruption, degradation, and destruction. For predictable and reliable space system operation, individual electronic components should be characterized to determine their SEE response. This report discusses the results of SEE testing performed on the ISL70040SEH and ISL73040SEH low-side GaN FET drivers.

Brand of Product：	Renesas
Part#：	ISL70040SEH 、 ISL73040SEH More Part#
Product Category：	electronic circuitry More
Application：	More
Data Type：	Test Report More
Safety & Environment Standards：	More
Operating Temperature：	Please see the document for details
Qualification Grade：	More
Qualification Approval：	More
Package：
Language：	English Chinese Chinese and English Japanese
Date of Creation：	Aug 30, 2017
Version Number：	Rev.0.00
Data Encoding：	TR052
Data Size：	405 KB

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